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Line shape and ray trace calculations in saturated X-ray lasers: Application to Ni-like silver

✍ Scribed by D. Benredjem; O. Guilbaud; C. Möller; A. Klisnick; D. Ros; J. Dubau; A. Calisti; B. Talin


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
219 KB
Volume
99
Category
Article
ISSN
0022-4073

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An empirical method is proposed for the correction of spectral interference between characteristic lines in XRF. The procedure is based on a coefficient which includes instrumental parameters and atomic properties and is obtained with the same standards as those used in calibration. This method has