Line defects in epitaxial silicon films grown at

✍ Scribed by K. Petter; D. Eyidi; M. Stöger-Pollach; I. Sieber; P. Schubert-Bischoff; B. Rau; A.T. Tham; P. Schattschneider; S. Gall; K. Lips; W. Fuhs

• Book ID: 108239023
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 280 KB
• Volume: 376-377
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/j.physb.2005.12.032