Light and current degradation of a-Si:H pin, nin and pip diodes detected with CPM

✍ Scribed by H.-C. Ostendorf; W. Kusian; W. Krühler; R. Schwarz

• Book ID: 115989217
• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 289 KB
• Volume: 164-166
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/0022-3093(93)91084-g