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Lifetime measurements with the pinhole method in presence of radiation trapping: II—application to Yb3+doped ceramics and crystals

✍ Scribed by G. Toci; D. Alderighi; A. Pirri; M. Vannini


Book ID
106030210
Publisher
Springer
Year
2011
Tongue
English
Weight
548 KB
Volume
106
Category
Article
ISSN
0721-7269

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