Let spectra of proton energy levels from 50 to 500 mev and their effectiveness for single event effects characterization of microelectronics

✍ Scribed by Hiemstra, D.M.; Blackmore, E.W.

• Book ID: 118148708
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 401 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2003.821811