Leonard C. Feldman, James W. Mayer. Fundamentals of surface and thin film analysis. North-Holland, New York–Amsterdam–London, 1986, 352 Seiten, 175 Abb., 9 Tabellen im Anhang, ca. 150 Literaturzitate. ISBN 0-444-00989-2. US $ 47.50/Dfl. 125.00. In the USA/Canada the book is available from Elsevier Sc. Publ. New York, N.Y. 10017

✍ Scribed by A. Meisel

• Publisher: John Wiley and Sons
• Year: 1987
• Tongue: English
• Weight: 84 KB
• Volume: 22
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.2170220503