[Lecture Notes in Physics] Nanoscale Spectroscopy and Its Applications to Semiconductor Research Volume 588 || Growth and Characterization of Ge Nanostructures on Si(111)
✍ Scribed by Watanabe, Yoshio; Salviati, Giancarlo; Heun, Stefan; Yamamoto, Naoki
- Book ID
- 120166983
- Publisher
- Springer Berlin Heidelberg
- Year
- 2002
- Tongue
- English
- Weight
- 199 KB
- Edition
- 1
- Category
- Article
- ISBN
- 3540458506
No coin nor oath required. For personal study only.
✦ Synopsis
Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.