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Leakage currents in Ba[sub 0.7]Sr[sub 0.3]TiO[sub 3] thin films for ultrahigh-density dynamic random access memories

✍ Scribed by Dietz, G. W.; Schumacher, M.; Waser, R.; Streiffer, S. K.; Basceri, C.; Kingon, A. I.

Book ID: 120082368
Publisher: American Institute of Physics
Year: 1997
Tongue: English
Weight: 366 KB
Volume: 82
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.366045

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