Leakage current, annealing, and deep defect production studies in neutron irradiated n-type Si-detectors

✍ Scribed by E. Borchi; R. Macii; C. Leroy; C. Manoukian-Bertrand; C. Furetta; R. Paludetto; S. Pensotti; P.G. Rancoita; M. Rattaggi; A. Seidman; L. Vismara

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 297 KB
• Volume: 301
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/0168-9002(91)90461-x