✦ LIBER ✦
LDD design tradeoffs for single transistor latch-up and hot carrier degradation control in accumulation mode FD SOI MOSFET's
✍ Scribed by Duan, F.L.; Sinha, S.P.; Ioannou, D.E.; Brady, F.T.
- Book ID
- 114536858
- Publisher
- IEEE
- Year
- 1997
- Tongue
- English
- Weight
- 185 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0018-9383
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