Lattice distortion and strain relaxation in epitaxial thin films of multiferroic TbMnO3 probed by X-ray diffractometry and micro-Raman spectroscopy

✍ Scribed by Hu, Y.; Stender, D.; Medarde, M.; Lippert, T.; Wokaun, A.; Schneider, C.W.

• Book ID: 120270054
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 810 KB
• Volume: 278
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2012.10.121