✦ LIBER ✦
Lattice Defects Diffuse Scattering from Thin Films of a Ge-Si System with Low-Energy Ar+and Xe+Bombardment During Molecular Beam Epitaxy (MBE) Growth
✍ Scribed by Paul Rozenak
- Book ID
- 120925456
- Publisher
- The Minerals, Metals & Materials Society
- Year
- 2012
- Tongue
- English
- Weight
- 918 KB
- Volume
- 44
- Category
- Article
- ISSN
- 1073-5623
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