Lattice and grain boundary diffusion of oxygen in titanium subhydride studied by Auger sputter profiling

An Auger sputter profiling study of nitr

An Auger sputter profiling study of nitrogen and oxygen ion implantations in two titanium alloys

✍ B. D. Barton; L. E. Pope; T. N. Wittberg 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 549 KB

## Abstract Samples of two titanium alloys, Ti–6Al–4V and Ti–15V–3Cr–3Sn–3Al, were ion implanted with a combination of nitrogen (N^+^) and oxygen (O^+^). For each alloy, implantation parameters were chosen to give implanted nitrogen concentrations of ∼10 or 50 at.%, from a depth of 100 nm to a dept