Copper thick film sintering studies in a
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Leslie F. Link; William R. Gerristead Jr.; Satish Tamhankar
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Article
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1993
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John Wiley and Sons
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English
โ 604 KB
## Abstract The significance of the ElectroScan environmental scanning electron microscope (ESEM) as a processing tool for studying dynamic morphological changes under controlled temperature/atmosphere conditions was evaluated. The ability to observe dynamic processes in situ, which cannot be achie