✦ LIBER ✦
Latent B-radiation damage in hermetically sealed NMOS devices: J. L. Boyle, R. C. McIntyre, R. E. Youtz and J. T. Nelson IEEE/Proc. IRPS 34 (1981)
- Book ID
- 108361223
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 114 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0026-2692
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