✦ LIBER ✦
Latch-up and timing failure analysis of CMOS VLSI using electron beam techniques : S. M. Davidson. IEEE 21st Ann. Proc. Reliab. Phys. 130 (1983)
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 86 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
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