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Laser photo-reflectance characterization of resonant nonlinear electro-refraction in thin semiconductor films

✍ Scribed by Will Chism; Jason Cartwright

Book ID: 116943629
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 410 KB
Volume: 520
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2012.06.065

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