Structural analysis of ELO-GaN grown on
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Miyajima, Takao ;Takeda, Shingo ;Tsusaka, Yoshiyuki ;Matsui, Junji ;Kudo, Yoshih
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Article
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2007
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John Wiley and Sons
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English
⚖ 206 KB
## Abstract Using micro‐beam X‐ray diffraction (XRD), small __c__‐axis tilting was observed in maskless epitaxially laterally overgrown GaN (ELO‐GaN), which is a suitable underlying layer for realizing a reliable GaN‐based blue‐violet laser diode. By analyzing the micro‐scale structure of ELO‐GaN w