Laser Infrared Photothermal Radiometric and ELYMAT Characterizations of p-Si Wafers Annealed in the Presence of an External Electric Field

✍ Scribed by Mandelis, A. ;Rodriguez, M.E. ;Raskin, Y. ;Gorodokin, V.

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 154 KB
• Volume: 185
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200106)185:2<471::aid-pssa471>3.0.co;2-l