๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Laser-induced thermal desorption mass spectrometry of functionalized silicon surfaces

โœ Scribed by Dominic Lingenfelser; Peter Hess

Book ID
108060232
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
772 KB
Volume
253
Category
Article
ISSN
0169-4332

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Deflection of laser-produced ions in las
Deflection of laser-produced ions in laser-induced thermal-desorption/Fourier-transform mass spectrometry for surface analysis
โœ Nick A. Thornburg; Ihab M. Abdelrehim; Steve Pullins; Donald P. Land ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 525 KB

A method for deflecting ions, such as K+, produced outside a Fourier-transform mass spectrometer cell during laser-induced thermal desorption, is described. This technique has been shown to deflect laser-generated K and Ti ions from two Ti foil samples (biomedical implant model surfaces), yielding m