Laser-induced thermal breakdown of a semiconductor in the presence of mutually correlated noises
โ Scribed by Yu. V. Gudyma
- Book ID
- 110125235
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 2000
- Tongue
- English
- Weight
- 38 KB
- Volume
- 26
- Category
- Article
- ISSN
- 1063-7850
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
We examine the mechanisms of cross-correlation of white multiplicative noise and white additive noise in a single-mode laser and establish a white-gain-noise model containing such a cross-correlation. We show that the cross-correlation between the white multiplicative noise and the white additive no
An investigation of the electrical breakdown behaviour of liquid nitrogen in the presence of a local hot spot on an electrode has been performed to determine the breakdown mechanism of liquid coolant in cryoresistive or superconducting apparatus under quenching conditions. It has been found that the