Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry

✍ Scribed by P Adamson

• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 320 KB
• Volume: 36
• Category: Article
• ISSN: 0030-3992
• DOI: 10.1016/j.optlastec.2004.01.022