✦ LIBER ✦
Large Within-Die Gate Delay Variations in Sub-Threshold Logic Circuits at Low Temperature
✍ Scribed by Takahashi, Ryo; Takata, Hidehiro; Yasufuku, Tadashi; Fuketa, Hiroshi; Takamiya, Makoto; Nomura, Masahiro; Shinohara, Hirofumi; Sakurai, Takayasu
- Book ID
- 118193759
- Publisher
- Institute of Electrical and Electronics Engineers
- Year
- 2012
- Tongue
- English
- Weight
- 234 KB
- Volume
- 59
- Category
- Article
- ISSN
- 1549-7747
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