✦ LIBER ✦
Large-scale electronic-structure theory and nanoscale defects formed in cleavage process of silicon
✍ Scribed by T. Hoshi; R. Takayama; Y. Iguchi; T. Fujiwara
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 306 KB
- Volume
- 376-377
- Category
- Article
- ISSN
- 0921-4526
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