✦ LIBER ✦
Large-scale broad-band parasitic extraction for fast layout verification of 3-D RF and mixed-signal on-chip structures
✍ Scribed by Feng Ling; Okhmatovski, V.I.; Harris, W.; McCracken, S.; Aykut Dengi
- Book ID
- 114660170
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 651 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0018-9480
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