Large Damage Threshold and Small Electron Escape Depth in X-ray Absorption Spectroscopy of a Conjugated Polymer Thin Film

✍ Scribed by Chua, Lay-Lay; Dipankar, Mandal; Sivaramakrishnan, Sankaran; Gao, Xingyu; Qi, Dongchen; Wee, Andrew T. S.; Ho, Peter K. H.

• Book ID: 120932972
• Publisher: American Chemical Society
• Year: 2006
• Tongue: English
• Weight: 279 KB
• Volume: 22
• Category: Article
• ISSN: 0743-7463
• DOI: 10.1021/la060974q