Large-area fault clusters and fault tolerance in VLSI circuits: a review : C. H. Stapper. IBM J. Res. Dev. 33 (2), 162 (1989)

• Book ID: 103284874
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 127 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90450-2