✦ LIBER ✦
Landis, D L and Singh, P: ‘A wafer scale IEEE 1149.1 case study’ Make Your Mark. Test Engineering Conference Proceedings. Your Weapon for Success in Today's Test Market, Atlanta, GA, USA, 24–27 June 1991 (Boston, MA, USA: Miller Freeman Expositions 1990) pp 1–9
- Book ID
- 103531306
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 116 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0141-9331
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