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Lack-of-fit tests based on weighted ratio of residuals and variances

✍ Scribed by Maozai Tian, Youxi Luo, Yunan Su, Yan Fan, Junlin Han

Book ID: 118813893
Publisher: Academy of Mathematics and Systems Science, Chinese Academy of Sciences
Year: 2012
Tongue: English
Weight: 425 KB
Volume: 25
Category: Article
ISSN: 1009-6124
DOI: 10.1007/s11424-012-0193-3

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