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La4(Si5.2Ge2.8O18)(TeO3)4 and La2(Si6O13)(TeO3)2: Intergrowth of the lanthanum(III) tellurite layer with the XO4 (X=Si/Ge) tetrahedral layer

✍ Scribed by Fang Kong; Hai-Long Jiang; Jiang-Gao Mao


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
798 KB
Volume
181
Category
Article
ISSN
0022-4596

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✍ Peter Babinec; Jerzy Leszczynski πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 206 KB πŸ‘ 3 views

The ab initio electronic structure calculations at the MP2 and the Becke Ε½ . 3LYP density functional levels in conjunction with the 6-311qqG 2 df, 2 pd basis set were used for the determination of the structure, vibrational spectra, and dissociation 2q 2q Ε½ . energies of the XH and XH X s C, Si, Ge