𝔖 Bobbio Scriptorium
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L. Reimer, Scanning Electron Microscopy — Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, Volume 45. Editiorial Board: J. M. Enoch, D. L. Macadam, A. L. Schawlow, K. Shimoda and T. Tamir). XVIII + 457 S., 247 Abb., 5 Tab. Berlin-Heidelberg-New York-Tokyo 1985. Springer Verlag. DM 112,00. ISBN: 3-540-13530-8

✍ Scribed by Augsten


Publisher
John Wiley and Sons
Year
1987
Tongue
English
Weight
98 KB
Volume
27
Category
Article
ISSN
0233-111X

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