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Kinetics of the Au-Ni-Sn ternary intermetallic layer redeposition at the solder/under-bump metallurgy interface during aging treatment

✍ Scribed by Jong-Hyun Lee; Jong-Whan Park; Dong Hyuk Shin; Yong-Seog Kim


Publisher
Springer US
Year
2004
Tongue
English
Weight
466 KB
Volume
33
Category
Article
ISSN
0361-5235

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