KFM detection of charges injected by AFM into a thin SiO2 layer containing Si nanocrystals

✍ Scribed by C. Dumas; L. Ressier; J. Grisolia; A. Arbouet; V. Paillard; G. BenAssayag; S. Schamm; P. Normand

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 253 KB
• Volume: 85
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2008.09.027