Just how reliable are plastic encapsulated semiconductors for military applications and how can the maximum reliability be obtained? : C. H. Taylor. Microelectron. and Reliab.15, 131 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 132 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90499-6