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Junction depth dependence of breakdown in silicon detector diodes

✍ Scribed by G.A. Beck; A.A. Carter; J.R. Carter; N.M. Greenwood; A.D. Lucas; D.J. Munday; T.W. Pritchard; D. Robinson; C.D. Wilburn; K. Wyllie

No coin nor oath required. For personal study only.

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