✦ LIBER ✦
Junction capacitance techniques to characterize radiation damage in silicon : J. W. Diebold and H. M. DeAngelis, Air Force Cambridge Res. Labs, Hanscom Field, Mass., U.S.A. AFCRL-TR-73-0157. (Mar. 1973)
- Book ID
- 103272061
- Publisher
- Elsevier Science
- Year
- 1974
- Tongue
- English
- Weight
- 126 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0026-2714
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