✦ LIBER ✦
Junction capacitance study of an oxygen impurity defect exhibiting configuration relaxation in amorphous silicon–germanium alloys deposited by hot-wire CVD
✍ Scribed by Shouvik Datta; J. David Cohen; Yueqin Xu; A.H. Mahan; Howard M. Branz
- Book ID
- 116670991
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 168 KB
- Volume
- 354
- Category
- Article
- ISSN
- 0022-3093
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