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Joint time-frequency measurements of modelocked semiconductor diode lasers and dynamics using frequency-resolved optical gating

✍ Scribed by Delfyett, P.J.; Hong Shi; Gee, S.; Nitta, I.; Connolly, J.C.; Alphonse, G.A.


Book ID
117869209
Publisher
IEEE
Year
1999
Tongue
English
Weight
556 KB
Volume
35
Category
Article
ISSN
0018-9197

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