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Johann crystal diffraction spectrometer for measuring small chemical shifts of soft X-ray lines

✍ Scribed by A. A. Petrunin; A. E. Sovestnov; A. V. Tyunis; É. V. Fomin

Book ID: 111450267
Publisher: SP MAIK Nauka/Interperiodica
Year: 2009
Tongue: English
Weight: 184 KB
Volume: 35
Category: Article
ISSN: 1063-7850
DOI: 10.1134/s1063785009010222

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