Jerky motion of grain boundaries in NiAl: an atomic force microscopy study
β Scribed by E. Rabkin; V. Semenov; T. Izyumova
- Book ID
- 114389056
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 289 KB
- Volume
- 42
- Category
- Article
- ISSN
- 1359-6462
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Atomic force microscopy (AFM) was used to characterize surface modiΓcations that developed from Vickers indentations into single-crystalline NiAl(100) and single-quasicrystalline AlPdMn (surface of Γvefold symmetry). Indenter rotation was used to track the competition between crystal and indenter an
We employed a scanning force microscopy technique to determine the ratio of grain boundary and surface energies in copper using the thermal grooving method. Samples of ultrafine grain copper obtained by four passes of equal channel angular pressing were heat treated in a reducing atmosphere at 400 Β°