J. Jimenez (ed.). Defect Recognition and Image Processing in Semiconductors and Divices. Proceedings of the fifth International Conference, Institute of Physics Conference Series Number 135, Santander, Spain, 6–10 September 1993. Institute of Physics Publishing, Bristol and Philadelphia, 417 pages. Price 95.00 US $. ISBN 0–7503–0294–1

✍ Scribed by G. Wagner

• Book ID: 102128305
• Publisher: John Wiley and Sons
• Year: 1995
• Tongue: English
• Weight: 95 KB
• Volume: 30
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.2170300822