IVa-5 leakage current and refresh time measurements on the charge-coupled RAM cell

✍ Scribed by Chatterjee, P.K.; Tasch, A.F., Jr.; Fu, H.-S.; Holloway, T.C.

• Book ID: 114592558
• Publisher: IEEE
• Year: 1977
• Tongue: English
• Weight: 271 KB
• Volume: 24
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1977.18952