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IVA-4 Suppression of deep-level trapping related effects in GaAs MESFET's using a buried-channel structure

✍ Scribed by Canfield, P.; Forbes, L.; Gleason, R.; McCamant, A.


Book ID
114595781
Publisher
IEEE
Year
1986
Tongue
English
Weight
159 KB
Volume
33
Category
Article
ISSN
0018-9383

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