IVA-2 in situ mobility profiling of short channel field-effect transistors using the Hall current technique

✍ Scribed by Andreou, A.G.; Westgate, C.R.; Thoma, M.J.

• Book ID: 114595779
• Publisher: IEEE
• Year: 1986
• Tongue: English
• Weight: 165 KB
• Volume: 33
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1986.22790