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Issues for single-event proton testing of SRAMs

✍ Scribed by Schwank, J.R.; Dodd, P.E.; Shaneyfelt, M.R.; Feli, J.A.; Hash, G.L.; Ferlet-Cavrois, V.; Paillet, P.; Baggio, J.; Tangyunyong, P.; Blackmore, E.

Book ID: 118148709
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 594 KB
Volume: 51
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2004.839301

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