Is there a reliable screen for VHF power transistors? : D. Sulway, J. Ingram-Cotton and J. P. M. Leduc. Proceedings 1972 Annual Reliability and Maintainability Symposium, San Francisco. IEEE Cat. No. 72CH0577-7R. 25–27 January (1972), p. 533

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 109 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(72)90377-0