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[IRE 1987 International Electron Devices Meeting - ()] 1987 International Electron Devices Meeting - A large area MOS-GTO with wafer-repair technique

✍ Scribed by Stoisiek, M.; Beyer, M.; Kiffe, W.; Schultz, H.-J.; Schmid, H.; Schwarzbauer, H.; Stengl, R.; Turkes, P.; Theis, D.

No coin nor oath required. For personal study only.

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