๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

[IRE 1986 International Electron Devices Meeting - ()] 1986 International Electron Devices Meeting - Lifetimes and substrate currents in static and dynamic hot-carrier degradation

โœ Scribed by Weber, W.; Werner, C.; Schwerin, A.V.


Book ID
120277419
Publisher
IRE
Year
1986
Weight
337 KB
Category
Article

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