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[IRE 1984 International Electron Devices Meeting - ()] 1984 International Electron Devices Meeting - Characterization of As-P double diffused drain structure

✍ Scribed by Balasubramanyam, K.; Hargrove, M.J.; Hanafi, H.I.; Lin, M.S.; Hoyniak, D.; LaRue, J.; Thomas, D.R.

No coin nor oath required. For personal study only.

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