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[IRE 1979 International Electron Devices Meeting - ()] 1979 International Electron Devices Meeting - Process statistics of submicron MOSFET's

✍ Scribed by Demoulin, E.; Greenfield, J.A.; Dutton, R.W.; Chatterjee, P.K.; Tasch, A.F.

No coin nor oath required. For personal study only.

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